Information card for entry 2023039

Structure parameters

• Common name: Bis[1-oxopyridin-2-olato(1-)]bis(<i>p</i>-tolyl)silicon(IV)
• Chemical name: Bis[1-oxopyridin-2-olato(1-)]bis(4-mwthylphenyl)silicon(IV)
• Formula: C24 H22 N2 O4 Si
• Calculated formula: C24 H22 N2 O4 Si
• Title of publication: Synthesis and crystal structures of bis-[1-oxopyridin-2-olato(1-)]bis-(penta-fluoro-phen-yl)silicon(IV)-tetra-hydro-furan-pentane (2/1/1), bis-[1-oxopyridin-2-olato(1-)]bis-(<i>p</i>-tol-yl)silicon(IV), and dimesitylbis[1-oxopyridin-2-olato(1-)]silicon(IV).
• Authors of publication: Kraft, Bradley M.; Brennessel, William W.; Andrews, Jordan W.; Viggiani, Michael T.; Kittrell, Nathan F.; Heckman, Matthew T.
• Journal of publication: Acta crystallographica. Section E, Crystallographic communications
• Year of publication: 2024
• Journal volume: 80
• Journal issue: Pt 3
• Pages of publication: 318 - 324
• a: 8.5662 ± 0.0008 Å
• b: 8.8343 ± 0.0008 Å
• c: 14.7801 ± 0.0014 Å
• α: 93.057 ± 0.002°
• β: 105.372 ± 0.0019°
• γ: 106.757 ± 0.0018°
• Cell volume: 1022.45 ± 0.17 ų
• Cell temperature: 100 ± 0.5 K
• Ambient diffraction temperature: 100 ± 0.5 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0887
• Residual factor for significantly intense reflections: 0.0541
• Weighted residual factors for significantly intense reflections: 0.1318
• Weighted residual factors for all reflections included in the refinement: 0.1487
• Goodness-of-fit parameter for all reflections included in the refinement: 1.051
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: Yes