Information card for entry 2108601

Structure parameters

• Formula: C36 H50 Si2
• Calculated formula: C36 H50 Si2
• SMILES: C(#Cc1c2ccccc2c(c2c1cccc2)C#C[Si](C(C)C)(C(C)C)C(C)C)[Si](C(C)C)(C(C)C)C(C)C
• Title of publication: Synthesis, crystal structure, polymorphism and microscopic luminescence properties of anthracene derivative compounds
• Authors of publication: Moliterni, Anna; Altamura, Davide; Lassandro, Rocco; Olieric, Vincent; Ferri, Gianmarco; Cardarelli, Francesco; Camposeo, Andrea; Pisignano, Dario; Anthony, John E.; Giannini, Cinzia
• Journal of publication: Acta Crystallographica Section B
• Year of publication: 2020
• Journal volume: 76
• Journal issue: 3
• a: 8.602 ± 0.0017 Å
• b: 10.085 ± 0.002 Å
• c: 11.209 ± 0.002 Å
• α: 115.07 ± 0.03°
• β: 102.61 ± 0.03°
• γ: 98.82 ± 0.03°
• Cell volume: 825.6 ± 0.4 ų
• Cell temperature: 296 ± 2 K
• Ambient diffraction temperature: 296 ± 2 K
• Number of distinct elements: 3
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0395
• Residual factor for significantly intense reflections: 0.0386
• Weighted residual factors for significantly intense reflections: 0.1151
• Weighted residual factors for all reflections included in the refinement: 0.1162
• Goodness-of-fit parameter for all reflections included in the refinement: 1.059
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.72932 Å
• Diffraction radiation type: synchrotron
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes