Information card for entry 2108600
| Formula |
C24 H22 F4 Si2 |
| Calculated formula |
C24 H22 F4 Si2 |
| SMILES |
[Si](C#Cc1c2cc3c(F)c(F)c(F)c(F)c3cc2c(cc1)C#C[Si](C)(C)C)(C)(C)C |
| Title of publication |
Synthesis, crystal structure, polymorphism and microscopic luminescence properties of anthracene derivative compounds |
| Authors of publication |
Moliterni, Anna; Altamura, Davide; Lassandro, Rocco; Olieric, Vincent; Ferri, Gianmarco; Cardarelli, Francesco; Camposeo, Andrea; Pisignano, Dario; Anthony, John E.; Giannini, Cinzia |
| Journal of publication |
Acta Crystallographica Section B |
| Year of publication |
2020 |
| Journal volume |
76 |
| Journal issue |
3 |
| a |
6.905 ± 0.0014 Å |
| b |
14.948 ± 0.003 Å |
| c |
23.66 ± 0.005 Å |
| α |
90° |
| β |
94.82 ± 0.03° |
| γ |
90° |
| Cell volume |
2433.5 ± 0.9 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0739 |
| Residual factor for significantly intense reflections |
0.048 |
| Weighted residual factors for significantly intense reflections |
0.1264 |
| Weighted residual factors for all reflections included in the refinement |
0.148 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.019 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.72932 Å |
| Diffraction radiation type |
synchrotron |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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