Information card for entry 2108800
| Common name |
4'-Iodo-2-fluorochalcone |
| Chemical name |
(2<i>E</i>)-3-(2-Fluorophenyl)-1-(4-iodophenyl)prop-2-en-1-one |
| Formula |
C15 H10 F I O |
| Calculated formula |
C15 H10 F I O |
| SMILES |
Ic1ccc(C(=O)/C=C/c2c(F)cccc2)cc1 |
| Title of publication |
Structural effects of halogen bonding in iodochalcones |
| Authors of publication |
Hamilton, Victoria; Harris, Connah; Hall, Charlie L.; Potticary, Jason; Cremeens, Matthew E.; D'Ambruoso, Gemma D.; Matsumoto, Masaomi; Warren, Stephen D.; Pridmore, Natalie E.; Sparkes, Hazel A.; Hall, Simon R. |
| Journal of publication |
Acta Crystallographica Section B |
| Year of publication |
2021 |
| Journal volume |
77 |
| Journal issue |
3 |
| a |
22.9802 ± 0.001 Å |
| b |
4.7448 ± 0.0002 Å |
| c |
12.2026 ± 0.0006 Å |
| α |
90° |
| β |
96.534 ± 0.002° |
| γ |
90° |
| Cell volume |
1321.89 ± 0.1 Å3 |
| Cell temperature |
100 K |
| Ambient diffraction temperature |
100 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0294 |
| Residual factor for significantly intense reflections |
0.0235 |
| Weighted residual factors for significantly intense reflections |
0.0544 |
| Weighted residual factors for all reflections included in the refinement |
0.0566 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.049 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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