Information card for entry 2108801
| Common name |
4'-Iodo-3-fluorochalcone |
| Chemical name |
(2<i>E</i>)-3-(3-Fluorophenyl)-1-(4-iodophenyl)prop-2-en-1-one |
| Formula |
C15 H10 F I O |
| Calculated formula |
C15 H10 F I O |
| SMILES |
Ic1ccc(C(=O)/C=C/c2cc(F)ccc2)cc1 |
| Title of publication |
Structural effects of halogen bonding in iodochalcones |
| Authors of publication |
Hamilton, Victoria; Harris, Connah; Hall, Charlie L.; Potticary, Jason; Cremeens, Matthew E.; D'Ambruoso, Gemma D.; Matsumoto, Masaomi; Warren, Stephen D.; Pridmore, Natalie E.; Sparkes, Hazel A.; Hall, Simon R. |
| Journal of publication |
Acta Crystallographica Section B |
| Year of publication |
2021 |
| Journal volume |
77 |
| Journal issue |
3 |
| a |
6.12 ± 0.0002 Å |
| b |
10.7976 ± 0.0003 Å |
| c |
20.3875 ± 0.0007 Å |
| α |
103.101 ± 0.002° |
| β |
95.16 ± 0.002° |
| γ |
98.186 ± 0.002° |
| Cell volume |
1288.32 ± 0.07 Å3 |
| Cell temperature |
100 K |
| Ambient diffraction temperature |
100 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.029 |
| Residual factor for significantly intense reflections |
0.0222 |
| Weighted residual factors for significantly intense reflections |
0.0491 |
| Weighted residual factors for all reflections included in the refinement |
0.0512 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.042 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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