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Information card for entry 2202321
Preview
Coordinates | 2202321.cif |
---|---|
Structure factors | 2202321.hkl |
Original IUCr paper | HTML |
Chemical name | 3-isopropylidenetetracyclo[3.2.0.0^2,7^.0^4,5^]heptane- 1,5,6,7-tetracarboxylic acid tetrakis(cyclohexylamide) |
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Formula | C38 H56 N4 O4 |
Calculated formula | C38 H56 N4 O4 |
SMILES | O=C(NC1CCCCC1)C12C3\C(=C(C)/C)C4C1(C4(C23C(=O)NC1CCCCC1)C(=O)NC1CCCCC1)C(=O)NC1CCCCC1 |
Title of publication | A tetrakis(secondary amide) derivative of quadricyclane: 3-isopropylidenetetracyclo[3.2.0.0^2,7^.0^4,6^]heptane-1,5,6,7-tetracarboxylic acid tetrakis(cyclohexylamide) |
Authors of publication | Winkler, Torsten; Herges, Rainer; Jones, Peter G.; Dix, Ina |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2003 |
Journal volume | 59 |
Journal issue | 8 |
Pages of publication | o1098 - o1100 |
a | 10.1995 ± 0.0014 Å |
b | 11.6467 ± 0.0016 Å |
c | 15.206 ± 0.002 Å |
α | 87.126 ± 0.003° |
β | 77.132 ± 0.003° |
γ | 81.3 ± 0.003° |
Cell volume | 1740.4 ± 0.4 Å3 |
Cell temperature | 143 ± 2 K |
Ambient diffraction temperature | 143 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0613 |
Residual factor for significantly intense reflections | 0.0385 |
Weighted residual factors for significantly intense reflections | 0.0952 |
Weighted residual factors for all reflections included in the refinement | 0.1051 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2202321.html
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