Information card for entry 2202322
| Chemical name |
7-isopropylidenenorborna-2,5-diene-2,3,5,6-tetracarboxylic acid tetrakis(diethylamide) |
| Formula |
C30 H48 N4 O4 |
| Calculated formula |
C30 H48 N4 O4 |
| SMILES |
O=C(N(CC)CC)C1=C(C2C(=C(C1C2=C(C)C)C(=O)N(CC)CC)C(=O)N(CC)CC)C(=O)N(CC)CC |
| Title of publication |
A tetrakis(tertiary amide) derivative of norbornadiene: 7-isopropylidenenorborna-2,5-diene-2,3,5,6-tetracarboxylic acid tetrakis(diethylamide) |
| Authors of publication |
Winkler, Torsten; Herges, Rainer; Jones, Peter G.; Dix, Ina |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2003 |
| Journal volume |
59 |
| Journal issue |
8 |
| Pages of publication |
o1101 - o1102 |
| a |
10.7945 ± 0.0012 Å |
| b |
25.449 ± 0.003 Å |
| c |
11.671 ± 0.0012 Å |
| α |
90° |
| β |
106.353 ± 0.003° |
| γ |
90° |
| Cell volume |
3076.4 ± 0.6 Å3 |
| Cell temperature |
133 ± 2 K |
| Ambient diffraction temperature |
133 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0736 |
| Residual factor for significantly intense reflections |
0.0417 |
| Weighted residual factors for significantly intense reflections |
0.0999 |
| Weighted residual factors for all reflections included in the refinement |
0.1137 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.938 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/2202322.html