Information card for entry 2202322
Chemical name |
7-isopropylidenenorborna-2,5-diene-2,3,5,6-tetracarboxylic acid tetrakis(diethylamide) |
Formula |
C30 H48 N4 O4 |
Calculated formula |
C30 H48 N4 O4 |
SMILES |
O=C(N(CC)CC)C1=C(C2C(=C(C1C2=C(C)C)C(=O)N(CC)CC)C(=O)N(CC)CC)C(=O)N(CC)CC |
Title of publication |
A tetrakis(tertiary amide) derivative of norbornadiene: 7-isopropylidenenorborna-2,5-diene-2,3,5,6-tetracarboxylic acid tetrakis(diethylamide) |
Authors of publication |
Winkler, Torsten; Herges, Rainer; Jones, Peter G.; Dix, Ina |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2003 |
Journal volume |
59 |
Journal issue |
8 |
Pages of publication |
o1101 - o1102 |
a |
10.7945 ± 0.0012 Å |
b |
25.449 ± 0.003 Å |
c |
11.671 ± 0.0012 Å |
α |
90° |
β |
106.353 ± 0.003° |
γ |
90° |
Cell volume |
3076.4 ± 0.6 Å3 |
Cell temperature |
133 ± 2 K |
Ambient diffraction temperature |
133 ± 2 K |
Number of distinct elements |
4 |
Space group number |
14 |
Hermann-Mauguin space group symbol |
P 1 21/n 1 |
Hall space group symbol |
-P 2yn |
Residual factor for all reflections |
0.0736 |
Residual factor for significantly intense reflections |
0.0417 |
Weighted residual factors for significantly intense reflections |
0.0999 |
Weighted residual factors for all reflections included in the refinement |
0.1137 |
Goodness-of-fit parameter for all reflections included in the refinement |
0.938 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2202322.html