Information card for entry 2227114
| Chemical name |
Diiodidobis(<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetramethylthiourea- κ<i>S</i>)cadmium(II) |
| Formula |
C10 H24 Cd I2 N4 S2 |
| Calculated formula |
C10 H24 Cd I2 N4 S2 |
| SMILES |
I[Cd]([S]=C(N(C)C)N(C)C)(I)[S]=C(N(C)C)N(C)C |
| Title of publication |
Diiodidobis(<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetramethylthiourea-κ<i>S</i>)cadmium(II) |
| Authors of publication |
Nawaz, Sidra; Sadaf, Sana; Fettouhi, Mohammed; Fazal, Atif; Ahmad, Saeed |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2010 |
| Journal volume |
66 |
| Journal issue |
8 |
| Pages of publication |
m951 |
| a |
18.985 ± 0.005 Å |
| b |
10.395 ± 0.003 Å |
| c |
13.719 ± 0.004 Å |
| α |
90° |
| β |
130.74 ± 0.004° |
| γ |
90° |
| Cell volume |
2051.4 ± 1 Å3 |
| Cell temperature |
294 ± 2 K |
| Ambient diffraction temperature |
294 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.0277 |
| Residual factor for significantly intense reflections |
0.0228 |
| Weighted residual factors for significantly intense reflections |
0.052 |
| Weighted residual factors for all reflections included in the refinement |
0.0542 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.038 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2227114.html