Information card for entry 2227115

Structure parameters

• Chemical name: Bis(tetraphenylphosphonium) bis[<i>N</i>-(phenylsulfonyl)dithiocarbimato- κ^2^<i>S</i>,<i>S</i>']platinate(II) monohydrate
• Formula: C62 H52 N2 O5 P2 Pt S6
• Calculated formula: C62 H52 N2 O5 P2 Pt S6
• SMILES: C1(=NS(=O)(=O)c2ccccc2)S[Pt]2(S1)SC(=NS(=O)(=O)c1ccccc1)S2.c1ccccc1[P+](c1ccccc1)(c1ccccc1)c1ccccc1.O.[P+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1
• Title of publication: Bis(tetraphenylphosphonium) bis[<i>N</i>-(phenylsulfonyl)dithiocarbimato-κ^2^<i>S</i>,<i>S</i>']platinate(II) monohydrate
• Authors of publication: Silvério, H. A.; Guilardi, S.; Flauzino Neto, Wilson P.; Amin, Raquel S.; Oliveira, Marcelo R. L.
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2010
• Journal volume: 66
• Journal issue: 8
• Pages of publication: m971 - m972
• a: 9.2972 ± 0.0001 Å
• b: 13.6482 ± 0.0003 Å
• c: 24.4279 ± 0.0005 Å
• α: 105.44 ± 0.001°
• β: 90.916 ± 0.001°
• γ: 107.777 ± 0.001°
• Cell volume: 2829.11 ± 0.09 ų
• Cell temperature: 120 ± 2 K
• Ambient diffraction temperature: 120 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for significantly intense reflections: 0.0263
• Weighted residual factors for all reflections included in the refinement: 0.0625
• Goodness-of-fit parameter for all reflections included in the refinement: 1.033
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes