Information card for entry 2234224

Structure parameters

• Common name: (<i>E</i>)-[1-(Thiophen-3-yl)ethylidene]({2-[(<i>E</i>)-[1-(thiophen-3-yl)\ ethylidene]amino]ethyl})amine
• Chemical name: <i>N</i>,<i>N</i>'-Bis[(<i>E</i>)-1-(thiophen-3-yl)ethylidene]ethane-1,2-diamine
• Formula: C14 H16 N2 S2
• Calculated formula: C14 H16 N2 S2
• SMILES: CC(=N\CC/N=C(/c1cscc1)C)/c1cscc1
• Title of publication: <i>N</i>,<i>N</i>'-Bis[(<i>E</i>)-1-(thiophen-3-yl)ethylidene]ethane-1,2-diamine
• Authors of publication: Asiri, Abdullah M.; Faidallah, Hassan M.; Khan, Khalid A.; Ng, Seik Weng; Tiekink, Edward R. T.
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2012
• Journal volume: 68
• Journal issue: 4
• Pages of publication: o1026
• a: 7.5231 ± 0.0006 Å
• b: 11.2338 ± 0.0006 Å
• c: 8.5967 ± 0.0006 Å
• α: 90°
• β: 112.894 ± 0.009°
• γ: 90°
• Cell volume: 669.3 ± 0.09 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 4
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0484
• Residual factor for significantly intense reflections: 0.0387
• Weighted residual factors for significantly intense reflections: 0.0985
• Weighted residual factors for all reflections included in the refinement: 0.105
• Goodness-of-fit parameter for all reflections included in the refinement: 1.064
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes