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Information card for entry 2243544
Preview
Coordinates | 2243544.cif |
---|---|
Structure factors | 2243544.hkl |
Original IUCr paper | HTML |
Chemical name | Bis[μ-1κ<i>N</i>:2(η^6^)-diphenylamido]bis[bis(diphenylamido-κ<i>N</i>)yttrium(III)] |
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Formula | C72 H60 N6 Y2 |
Calculated formula | C72 H60 N6 Y2 |
SMILES | N([Y](N(c1ccccc1)c1ccccc1)N(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Synthesis and crystallographic characterization of diphenylamide rare-earth metal complexes <i>Ln</i>(NPh~2~)~3~(THF)~2~ and [(Ph~2~N)~2~<i>Ln</i>(μ-NPh~2~)]~2~ |
Authors of publication | Palumbo, Chad T.; Kotyk, Christopher M.; Ziller, Joseph W.; Evans, William J. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2020 |
Journal volume | 76 |
Journal issue | 9 |
Pages of publication | 1447 - 1453 |
a | 9.2776 ± 0.0005 Å |
b | 22.5591 ± 0.0013 Å |
c | 13.4791 ± 0.0008 Å |
α | 90° |
β | 91.4966 ± 0.0009° |
γ | 90° |
Cell volume | 2820.1 ± 0.3 Å3 |
Cell temperature | 88 ± 2 K |
Ambient diffraction temperature | 88 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0447 |
Residual factor for significantly intense reflections | 0.0315 |
Weighted residual factors for significantly intense reflections | 0.0655 |
Weighted residual factors for all reflections included in the refinement | 0.0697 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.03 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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The link is: https://www.crystallography.net/2243544.html
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