Information card for entry 4000174

Structure parameters

• Formula: Ga4.4 Ge0.6 Ni2 Y0.59
• Calculated formula: Ga4.39 Ge0.6 Ni2 Y0.59
• Journal of publication: Chemistry of Materials
• Year of publication: 2002
• a: 4.1344 ± 0.0011 Å
• b: 4.1344 ± 0.0011 Å
• c: 15.887 ± 0.006 Å
• α: 90°
• β: 90°
• γ: 120°
• Cell volume: 235.18 ± 0.12 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 4
• Space group number: 194
• Hermann-Mauguin space group symbol: P 63/m m c
• Hall space group symbol: -P 6c 2c
• Residual factor for all reflections: 0.032
• Residual factor for significantly intense reflections: 0.032
• Weighted residual factors for significantly intense reflections: 0.0826
• Weighted residual factors for all reflections included in the refinement: 0.0826
• Goodness-of-fit parameter for all reflections included in the refinement: 1.221
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No