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Information card for entry 4000758
Preview
Coordinates | 4000758.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | (2,2,6,6-tetramethylheptane-3,5-dionato)silver(i)-triethylphosphine |
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Formula | C34 H68 Ag2 O4 P2 |
Calculated formula | C34 H68 Ag2 O4 P2 |
SMILES | [Ag]1([P](CC)(CC)CC)[O]=C(C=C(O1)C(C)(C)C)C(C)(C)C |
Title of publication | Plasma-Enhanced Atomic Layer Deposition of Silver Thin Films |
Authors of publication | Kariniemi, Maarit; Niinistö, Jaakko; Hatanpää, Timo; Kemell, Marianna; Sajavaara, Timo; Ritala, Mikko; Leskelä, Markku |
Journal of publication | Chemistry of Materials |
Year of publication | 2011 |
Journal volume | 23 |
Journal issue | 11 |
Pages of publication | 2901 |
a | 11.004 ± 0.002 Å |
b | 13.139 ± 0.003 Å |
c | 15.31 ± 0.003 Å |
α | 81.67 ± 0.03° |
β | 87.02 ± 0.03° |
γ | 69.85 ± 0.03° |
Cell volume | 2056.1 ± 0.8 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0441 |
Residual factor for significantly intense reflections | 0.0279 |
Weighted residual factors for significantly intense reflections | 0.0555 |
Weighted residual factors for all reflections included in the refinement | 0.0606 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.987 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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