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Information card for entry 4000759
Preview
Coordinates | 4000759.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | (2,2-dimethyl-6,6,7,7,8,8,8-heptafluoroocta-3,5-dionato)silver(I)-triethylphosphine |
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Formula | C16 H25 Ag F7 O2 P |
Calculated formula | C16 H25 Ag F7 O2 P |
SMILES | [Ag]1(OC(=CC(=[O]1)C(C)(C)C)C(F)(F)C(F)(F)C(F)(F)F)[P](CC)(CC)CC |
Title of publication | Plasma-Enhanced Atomic Layer Deposition of Silver Thin Films |
Authors of publication | Kariniemi, Maarit; Niinistö, Jaakko; Hatanpää, Timo; Kemell, Marianna; Sajavaara, Timo; Ritala, Mikko; Leskelä, Markku |
Journal of publication | Chemistry of Materials |
Year of publication | 2011 |
Journal volume | 23 |
Journal issue | 11 |
Pages of publication | 2901 |
a | 15.573 ± 0.003 Å |
b | 16.835 ± 0.003 Å |
c | 16.276 ± 0.003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4267.1 ± 1.4 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 60 |
Hermann-Mauguin space group symbol | P b c n |
Hall space group symbol | -P 2n 2ab |
Residual factor for all reflections | 0.0987 |
Residual factor for significantly intense reflections | 0.0751 |
Weighted residual factors for significantly intense reflections | 0.1773 |
Weighted residual factors for all reflections included in the refinement | 0.1893 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.911 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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