Information card for entry 4000759
| Chemical name |
(2,2-dimethyl-6,6,7,7,8,8,8-heptafluoroocta-3,5-dionato)silver(I)-triethylphosphine |
| Formula |
C16 H25 Ag F7 O2 P |
| Calculated formula |
C16 H25 Ag F7 O2 P |
| SMILES |
[Ag]1(OC(=CC(=[O]1)C(C)(C)C)C(F)(F)C(F)(F)C(F)(F)F)[P](CC)(CC)CC |
| Title of publication |
Plasma-Enhanced Atomic Layer Deposition of Silver Thin Films |
| Authors of publication |
Kariniemi, Maarit; Niinistö, Jaakko; Hatanpää, Timo; Kemell, Marianna; Sajavaara, Timo; Ritala, Mikko; Leskelä, Markku |
| Journal of publication |
Chemistry of Materials |
| Year of publication |
2011 |
| Journal volume |
23 |
| Journal issue |
11 |
| Pages of publication |
2901 |
| a |
15.573 ± 0.003 Å |
| b |
16.835 ± 0.003 Å |
| c |
16.276 ± 0.003 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
4267.1 ± 1.4 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
60 |
| Hermann-Mauguin space group symbol |
P b c n |
| Hall space group symbol |
-P 2n 2ab |
| Residual factor for all reflections |
0.0987 |
| Residual factor for significantly intense reflections |
0.0751 |
| Weighted residual factors for significantly intense reflections |
0.1773 |
| Weighted residual factors for all reflections included in the refinement |
0.1893 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.911 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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