Information card for entry 4000982
| Common name |
C10-BSBS |
| Chemical name |
C10-BSBS |
| Formula |
C34 H48 Se2 |
| Calculated formula |
C34 H48 Se2 |
| SMILES |
CCCCCCCCCCc1ccc2c(c1)[se]c1c2[se]c2c1ccc(c2)CCCCCCCCCC |
| Title of publication |
Solution-Processible Organic Semiconductors Based on Selenophene-Containing Heteroarenes, 2,7-Dialkyl[1]benzoselenopheno[3,2-b][1]benzoselenophenes (Cn-BSBSs): Syntheses, Properties, Molecular Arrangements, and Field-Effect Transistor Characteristics |
| Authors of publication |
Izawa, Takafumi; Miyazaki, Eigo; Takimiya, Kazuo |
| Journal of publication |
Chemistry of Materials |
| Year of publication |
2009 |
| Journal volume |
21 |
| Journal issue |
5 |
| Pages of publication |
903 |
| a |
5.6136 ± 0.0011 Å |
| b |
7.2956 ± 0.0017 Å |
| c |
36.003 ± 0.01 Å |
| α |
90° |
| β |
92.881 ± 0.01° |
| γ |
90° |
| Cell volume |
1472.6 ± 0.6 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0434 |
| Residual factor for significantly intense reflections |
0.0342 |
| Weighted residual factors for significantly intense reflections |
0.0812 |
| Weighted residual factors for all reflections included in the refinement |
0.083 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.134 |
| Diffraction radiation wavelength |
0.71075 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4000982.html