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Information card for entry 4001659
Preview
Coordinates | 4001659.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | (η^7^-cycloheptatrienyl)-(η^5^-methylcyclopentadienyl)-zirconium |
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Formula | C13 H14 Zr |
Calculated formula | C13 H14 Zr |
SMILES | [Zr]123456789%10([cH]%11[c]2([cH]1[cH]5[cH]8%11)C)[CH]1=[CH]3C9[CH]%10=[CH]6[CH]4=[CH]71 |
Title of publication | Cycloheptatrienyl-Cyclopentadienyl Heteroleptic Precursors for Atomic Layer Deposition of Group 4 Oxide Thin Films |
Authors of publication | Niinistö, Jaakko; Hatanpää, Timo; Kariniemi, Maarit; Mäntymäki, Miia; Costelle, Leila; Mizohata, Kenichiro; Kukli, Kaupo; Ritala, Mikko; Leskelä, Markku |
Journal of publication | Chemistry of Materials |
Year of publication | 2012 |
Journal volume | 24 |
Journal issue | 11 |
Pages of publication | 2002 |
a | 12.475 ± 0.003 Å |
b | 8.2371 ± 0.0016 Å |
c | 11.536 ± 0.002 Å |
α | 90° |
β | 113.73 ± 0.03° |
γ | 90° |
Cell volume | 1085.2 ± 0.5 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0284 |
Residual factor for significantly intense reflections | 0.0234 |
Weighted residual factors for significantly intense reflections | 0.0894 |
Weighted residual factors for all reflections included in the refinement | 0.0988 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.88 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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