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Information card for entry 4001779
Preview
Coordinates | 4001779.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | La9.5 O26 Si5.87 |
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Calculated formula | La9.5024 O26 Si5.8728 |
Title of publication | Crystal Structure and Oxide-Ion Conductivity alongc-Axis of Si-Deficient Apatite-Type Lanthanum Silicate |
Authors of publication | Fukuda, Koichiro; Asaka, Toru; Hara, Shinji; Oyabu, Masayuki; Berghout, Abid; Béchade, Emilie; Masson, Olivier; Julien, Isabelle; Thomas, Philippe |
Journal of publication | Chemistry of Materials |
Year of publication | 2013 |
Journal volume | 25 |
Journal issue | 10 |
Pages of publication | 2154 |
a | 9.7094 ± 0.0001 Å |
b | 9.7094 ± 0.0001 Å |
c | 7.1816 ± 0.0001 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 586.323 ± 0.012 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 3 |
Space group number | 176 |
Hermann-Mauguin space group symbol | P 63/m |
Hall space group symbol | -P 6c |
Residual factor for all reflections | 0.0267 |
Residual factor for significantly intense reflections | 0.0156 |
Weighted residual factors for significantly intense reflections | 0.0173 |
Weighted residual factors for all reflections included in the refinement | 0.0185 |
Goodness-of-fit parameter for significantly intense reflections | 1.04 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.98 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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