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Information card for entry 4001778
Preview
Coordinates | 4001778.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | K1.316 Mg0.658 S4 Sn1.342 |
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Calculated formula | K1.32 Mg0.66 S4 Sn1.34 |
Title of publication | Selective Removal of Cs+, Sr2+, and Ni2+by K2xMgxSn3‒xS6(x= 0.5‒1) (KMS-2) Relevant to Nuclear Waste Remediation |
Authors of publication | Mertz, Joshua L.; Fard, Zohreh Hassanzadeh; Malliakas, Christos D.; Manos, Manolis J.; Kanatzidis, Mercouri G. |
Journal of publication | Chemistry of Materials |
Year of publication | 2013 |
Journal volume | 25 |
Journal issue | 10 |
Pages of publication | 2116 |
a | 3.6749 ± 0.0004 Å |
b | 3.6749 ± 0.0004 Å |
c | 16.827 ± 0.004 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 196.8 ± 0.06 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 4 |
Space group number | 194 |
Hermann-Mauguin space group symbol | P 63/m m c |
Hall space group symbol | -P 6c 2c |
Residual factor for all reflections | 0.0557 |
Residual factor for significantly intense reflections | 0.0437 |
Weighted residual factors for significantly intense reflections | 0.1198 |
Weighted residual factors for all reflections included in the refinement | 0.123 |
Goodness-of-fit parameter for significantly intense reflections | 2.51 |
Goodness-of-fit parameter for all reflections included in the refinement | 2.4 |
Diffraction radiation wavelength | 0.4428 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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