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Information card for entry 4001962
Preview
| Coordinates | 4001962.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C80 H68 Cl12 N2 O8 |
|---|---|
| Calculated formula | C74.2 H56 N2 O8 |
| SMILES | COc1ccc(cc1)c1c2c(c(c3c1C(=O)N(C3=O)CCCCCCCCCCCCN1C(=O)c3c(C1=O)c(c1ccc(cc1)OC)c1c(c3c3ccc(cc3)OC)c3cccc4c3c1ccc4)c1ccc(cc1)OC)c1c3c2cccc3ccc1 |
| Title of publication | Alkylene-Chain Effect on Microwire Growth and Crystal Packing of π-Moieties |
| Authors of publication | Ding, Lin; Li, Hai-Bin; Lei, Ting; Ying, Han-Ze; Wang, Rui-Bo; Zhou, Yan; Su, Zhong-Min; Pei, Jian |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2012 |
| Journal volume | 24 |
| Journal issue | 10 |
| Pages of publication | 1944 |
| a | 9.756 ± 0.002 Å |
| b | 13.361 ± 0.003 Å |
| c | 15.794 ± 0.003 Å |
| α | 104.18 ± 0.03° |
| β | 103.41 ± 0.03° |
| γ | 100.78 ± 0.03° |
| Cell volume | 1875.6 ± 0.9 Å3 |
| Cell temperature | 113 ± 2 K |
| Ambient diffraction temperature | 113 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.4862 |
| Residual factor for significantly intense reflections | 0.4538 |
| Weighted residual factors for significantly intense reflections | 0.7954 |
| Weighted residual factors for all reflections included in the refinement | 0.8236 |
| Goodness-of-fit parameter for all reflections included in the refinement | 3.588 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.