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Information card for entry 4001963
Preview
Coordinates | 4001963.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C69 H48 Cl6 N2 O8 |
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Calculated formula | C69 H48 Cl6 N2 O8 |
SMILES | N1(CCCN2C(=O)c3c(c4c5cccc6c5c(ccc6)c4c(c3C2=O)c2ccc(OC)cc2)c2ccc(OC)cc2)C(=O)c2c(c3c4cccc5c4c(ccc5)c3c(c2C1=O)c1ccc(OC)cc1)c1ccc(OC)cc1.C(Cl)(Cl)Cl.C(Cl)(Cl)Cl |
Title of publication | Alkylene-Chain Effect on Microwire Growth and Crystal Packing of π-Moieties |
Authors of publication | Ding, Lin; Li, Hai-Bin; Lei, Ting; Ying, Han-Ze; Wang, Rui-Bo; Zhou, Yan; Su, Zhong-Min; Pei, Jian |
Journal of publication | Chemistry of Materials |
Year of publication | 2012 |
Journal volume | 24 |
Journal issue | 10 |
Pages of publication | 1944 |
a | 13.507 ± 0.004 Å |
b | 14.759 ± 0.005 Å |
c | 15.313 ± 0.005 Å |
α | 110.149 ± 0.007° |
β | 90.272 ± 0.004° |
γ | 91.206 ± 0.004° |
Cell volume | 2865 ± 1.6 Å3 |
Cell temperature | 113 ± 2 K |
Ambient diffraction temperature | 113 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1003 |
Residual factor for significantly intense reflections | 0.0709 |
Weighted residual factors for significantly intense reflections | 0.1843 |
Weighted residual factors for all reflections included in the refinement | 0.2066 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.058 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4001963.html
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