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Information card for entry 4001965
Preview
Coordinates | 4001965.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C70 H51 Cl3 N2 O8 |
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Calculated formula | C70 H51 Cl3 N2 O8 |
SMILES | O(c1ccc(c2c3C(=O)N(C(=O)c3c(c3c2c2cccc4cccc3c24)c2ccc(OC)cc2)CCCCCN2C(=O)c3c(c4c5cccc6cccc(c56)c4c(c3C2=O)c2ccc(OC)cc2)c2ccc(OC)cc2)cc1)C.C(Cl)(Cl)Cl |
Title of publication | Alkylene-Chain Effect on Microwire Growth and Crystal Packing of π-Moieties |
Authors of publication | Ding, Lin; Li, Hai-Bin; Lei, Ting; Ying, Han-Ze; Wang, Rui-Bo; Zhou, Yan; Su, Zhong-Min; Pei, Jian |
Journal of publication | Chemistry of Materials |
Year of publication | 2012 |
Journal volume | 24 |
Journal issue | 10 |
Pages of publication | 1944 |
a | 26.823 ± 0.008 Å |
b | 8.243 ± 0.002 Å |
c | 27.085 ± 0.008 Å |
α | 90° |
β | 108.789 ± 0.005° |
γ | 90° |
Cell volume | 5669 ± 3 Å3 |
Cell temperature | 113 ± 2 K |
Ambient diffraction temperature | 113 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1135 |
Residual factor for significantly intense reflections | 0.0841 |
Weighted residual factors for significantly intense reflections | 0.1603 |
Weighted residual factors for all reflections included in the refinement | 0.173 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.185 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4001965.html
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