Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4023553
Preview
Coordinates | 4023553.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C66 H60 |
---|---|
Calculated formula | C66 H60 |
SMILES | c1(cc2c3ccc(cc3)c3ccc(c4c(cc(CC)c(c4)CC)c4ccc(cc4)c4ccc(c5c(cc(CC)c(c5)CC)c5ccc(cc5)c5ccc(c2cc1CC)cc5)cc4)cc3)CC |
Title of publication | Synthesis of Nonaphenylenes and Dodecaphenylenes Using Electron-Transfer Oxidation of Lipshutz Cuprates and Formation of Nanostructural Materials from Hexadodecyloxynonaphenylene |
Authors of publication | M. Jalilur Rahman; Jun Yamakawa; Aoi Matsumoto; Hideo Enozawa; Tohru Nishinaga; Kenji Kamada; Masahiko Iyoda |
Journal of publication | Journal of Organic Chemistry |
Year of publication | 2008 |
Journal volume | 73 |
Pages of publication | 5542 - 5548 |
a | 17.9043 ± 0.0018 Å |
b | 17.9043 ± 0.0018 Å |
c | 28.214 ± 0.004 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 7832.7 ± 1.5 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 2 |
Space group number | 167 |
Hermann-Mauguin space group symbol | R -3 c :H |
Hall space group symbol | -R 3 2"c |
Residual factor for all reflections | 0.1523 |
Residual factor for significantly intense reflections | 0.0542 |
Weighted residual factors for significantly intense reflections | 0.1612 |
Weighted residual factors for all reflections included in the refinement | 0.1985 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.007 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4023553.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.