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Information card for entry 4031714
Preview
Coordinates | 4031714.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C51.3 H47.3 Cl21.9 S14 Si5 |
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Calculated formula | C44 H40 S14 Si5 |
SMILES | c12c(c3c(s1)sc1c3cc(s1)[Si](C)(C)C)Sc1c([Si]32c2c(c4c(s2)sc2c4cc(s2)[Si](C)(C)C)Sc2c3sc3c2c2c(s3)sc(c2)[Si](C)(C)C)sc2c1c1c(s2)sc(c1)[Si](C)(C)C |
Title of publication | Silicon Spiro Double Helicene-like Compounds Based on Dithieno[2,3-b:3',2'-d]thiophene: Syntheses and Crystal Structures. |
Authors of publication | Li, Chunli; Wu, Longlong; Xu, Wan; Song, Jinsheng; Shi, Jianwu; Yu, Panpan; Kan, Yuhe; Wang, Hua |
Journal of publication | The Journal of organic chemistry |
Year of publication | 2015 |
Journal volume | 80 |
Journal issue | 21 |
Pages of publication | 11156 - 11161 |
a | 11.792 ± 0.005 Å |
b | 13.295 ± 0.005 Å |
c | 44.329 ± 0.018 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 6950 ± 5 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296.15 K |
Number of distinct elements | 5 |
Space group number | 50 |
Hermann-Mauguin space group symbol | P b a n :2 |
Hall space group symbol | -P 2ab 2b |
Residual factor for all reflections | 0.118 |
Residual factor for significantly intense reflections | 0.0877 |
Weighted residual factors for significantly intense reflections | 0.2543 |
Weighted residual factors for all reflections included in the refinement | 0.2685 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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