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Information card for entry 4031736
Preview
Coordinates | 4031736.cif |
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Original paper (by DOI) | HTML |
Formula | C24 H26 Br2 Si2 |
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Calculated formula | C24 H26 Br2 Si2 |
SMILES | Brc1ccc(C(=C(C#C[Si](C)(C)C)\c2ccc(Br)cc2)\C#C[Si](C)(C)C)cc1 |
Title of publication | Cross-Conjugated Systems Based On An (E)-Hexa-3-en-1,5-diyne-3,4-diyl Skeleton: Spectroscopic and Spectroelectrochemical Investigations. |
Authors of publication | Gluyas, Josef B. G.; Manici, Valentina; Gückel, Simon; Vincent, Kevin B.; Yufit, Dmitry S.; Howard, Judith A. K.; Skelton, Brian W.; Beeby, Andrew; Kaupp, Martin; Low, Paul J. |
Journal of publication | The Journal of organic chemistry |
Year of publication | 2015 |
Journal volume | 80 |
Journal issue | 22 |
Pages of publication | 11501 - 11512 |
a | 7.578 ± 0.0005 Å |
b | 9.1129 ± 0.0006 Å |
c | 9.9879 ± 0.0007 Å |
α | 114.28 ± 0.002° |
β | 94.306 ± 0.002° |
γ | 95.903 ± 0.002° |
Cell volume | 620.13 ± 0.07 Å3 |
Cell temperature | 120 K |
Ambient diffraction temperature | 120 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0581 |
Residual factor for significantly intense reflections | 0.0363 |
Weighted residual factors for significantly intense reflections | 0.0784 |
Weighted residual factors for all reflections included in the refinement | 0.0887 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Diffraction radiation X-ray symbol | K-L~3~ |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4031736.html
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