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Information card for entry 4031736
Preview
| Coordinates | 4031736.cif |
|---|---|
| Original paper (by DOI) | HTML |
| External links | PubChem |
| Formula | C24 H26 Br2 Si2 |
|---|---|
| Calculated formula | C24 H26 Br2 Si2 |
| SMILES | Brc1ccc(C(=C(C#C[Si](C)(C)C)\c2ccc(Br)cc2)\C#C[Si](C)(C)C)cc1 |
| Title of publication | Cross-Conjugated Systems Based On An (E)-Hexa-3-en-1,5-diyne-3,4-diyl Skeleton: Spectroscopic and Spectroelectrochemical Investigations. |
| Authors of publication | Gluyas, Josef B. G.; Manici, Valentina; Gückel, Simon; Vincent, Kevin B.; Yufit, Dmitry S.; Howard, Judith A. K.; Skelton, Brian W.; Beeby, Andrew; Kaupp, Martin; Low, Paul J. |
| Journal of publication | The Journal of organic chemistry |
| Year of publication | 2015 |
| Journal volume | 80 |
| Journal issue | 22 |
| Pages of publication | 11501 - 11512 |
| a | 7.578 ± 0.0005 Å |
| b | 9.1129 ± 0.0006 Å |
| c | 9.9879 ± 0.0007 Å |
| α | 114.28 ± 0.002° |
| β | 94.306 ± 0.002° |
| γ | 95.903 ± 0.002° |
| Cell volume | 620.13 ± 0.07 Å3 |
| Cell temperature | 120 K |
| Ambient diffraction temperature | 120 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0581 |
| Residual factor for significantly intense reflections | 0.0363 |
| Weighted residual factors for significantly intense reflections | 0.0784 |
| Weighted residual factors for all reflections included in the refinement | 0.0887 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Diffraction radiation X-ray symbol | K-L~3~ |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4031736.html
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Users of the data should acknowledge the original authors of the
structural data.