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Information card for entry 4031737
Preview
Coordinates | 4031737.cif |
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Original paper (by DOI) | HTML |
Formula | C36 H50 Br2 Si2 |
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Calculated formula | C36 H50 Br2 Si2 |
SMILES | C(=C(C#C[Si](C(C)C)(C(C)C)C(C)C)\c1ccc(cc1)Br)(c1ccc(cc1)Br)\C#C[Si](C(C)C)(C(C)C)C(C)C |
Title of publication | Cross-Conjugated Systems Based On An (E)-Hexa-3-en-1,5-diyne-3,4-diyl Skeleton: Spectroscopic and Spectroelectrochemical Investigations. |
Authors of publication | Gluyas, Josef B. G.; Manici, Valentina; Gückel, Simon; Vincent, Kevin B.; Yufit, Dmitry S.; Howard, Judith A. K.; Skelton, Brian W.; Beeby, Andrew; Kaupp, Martin; Low, Paul J. |
Journal of publication | The Journal of organic chemistry |
Year of publication | 2015 |
Journal volume | 80 |
Journal issue | 22 |
Pages of publication | 11501 - 11512 |
a | 10.5232 ± 0.0005 Å |
b | 8.0808 ± 0.0004 Å |
c | 20.885 ± 0.0011 Å |
α | 90° |
β | 102.194 ± 0.002° |
γ | 90° |
Cell volume | 1735.9 ± 0.15 Å3 |
Cell temperature | 120 K |
Ambient diffraction temperature | 120 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0515 |
Residual factor for significantly intense reflections | 0.0339 |
Weighted residual factors for significantly intense reflections | 0.0711 |
Weighted residual factors for all reflections included in the refinement | 0.0764 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.039 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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