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Information card for entry 4066250
Preview
Coordinates | 4066250.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C48 H58 Li2 N4 P4 |
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Calculated formula | C48 H58 Li2 N4 P4 |
SMILES | C(C)(C)[N]12P(c3ccccc3)N(C(C)C)[P](c3ccccc3)(c3ccccc3)[Li]1[N]1(C(C)C)P(c3ccccc3)N(C(C)C)[P](c3ccccc3)(c3ccccc3)[Li]21 |
Title of publication | Metalation and Transmetalation Studies on Ph2PN(iPr)P(Ph)N(iPr)H for Selective Ethene Trimerization to 1-Hexene⊥ |
Authors of publication | Peitz, Stephan; Peulecke, Normen; Aluri, Bhaskar R.; Müller, Bernd H.; Spannenberg, Anke; Rosenthal, Uwe; Al-Hazmi, Mohammed H.; Mosa, Fuad M.; Wöhl, Anina; Müller, Wolfgang |
Journal of publication | Organometallics |
Year of publication | 2010 |
Journal volume | 29 |
Journal issue | 21 |
Pages of publication | 5263 |
a | 8.3004 ± 0.0004 Å |
b | 10.9215 ± 0.0005 Å |
c | 13.8691 ± 0.0006 Å |
α | 68.249 ± 0.003° |
β | 77.522 ± 0.004° |
γ | 74.391 ± 0.003° |
Cell volume | 1115.14 ± 0.09 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0417 |
Residual factor for significantly intense reflections | 0.0311 |
Weighted residual factors for significantly intense reflections | 0.0791 |
Weighted residual factors for all reflections included in the refinement | 0.0817 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.988 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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