Information card for entry 4066249
| Formula |
C30 H45 Li N4 P2 |
| Calculated formula |
C30 H45 Li N4 P2 |
| SMILES |
C(C)(C)N([Li]1[N](CC[N]1(C)C)(C)C)P(c1ccccc1)N(C(C)C)P(c1ccccc1)c1ccccc1 |
| Title of publication |
Metalation and Transmetalation Studies on Ph2PN(iPr)P(Ph)N(iPr)H for Selective Ethene Trimerization to 1-Hexene⊥ |
| Authors of publication |
Peitz, Stephan; Peulecke, Normen; Aluri, Bhaskar R.; Müller, Bernd H.; Spannenberg, Anke; Rosenthal, Uwe; Al-Hazmi, Mohammed H.; Mosa, Fuad M.; Wöhl, Anina; Müller, Wolfgang |
| Journal of publication |
Organometallics |
| Year of publication |
2010 |
| Journal volume |
29 |
| Journal issue |
21 |
| Pages of publication |
5263 |
| a |
10.2842 ± 0.0003 Å |
| b |
18.2568 ± 0.0007 Å |
| c |
17.3893 ± 0.0006 Å |
| α |
90° |
| β |
105.178 ± 0.003° |
| γ |
90° |
| Cell volume |
3151.06 ± 0.19 Å3 |
| Cell temperature |
200 ± 2 K |
| Ambient diffraction temperature |
200 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0559 |
| Residual factor for significantly intense reflections |
0.0321 |
| Weighted residual factors for significantly intense reflections |
0.0741 |
| Weighted residual factors for all reflections included in the refinement |
0.0785 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.863 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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