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Information card for entry 4066711
Preview
| Coordinates | 4066711.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C29 H34 O2 Si2 W |
|---|---|
| Calculated formula | C29 H34 O2 Si2 W |
| SMILES | [W]12345([Si]6(C1=C6[Si](C)(C)C)(c1ccccc1)c1ccccc1)(C#[O])(C#[O])[c]1([c]2([c]3([c]4([c]51C)C)C)C)C |
| Title of publication | Conversion of an Acetylide−Silylene Complex to an Alkenylcarbyne Complex by Consecutive Ketone Addition and Base-Induced Silanone Elimination |
| Authors of publication | Sakaba, Hiroyuki; Yabe-Yoshida, Mako; Oike, Hiroyuki; Kabuto, Chizuko |
| Journal of publication | Organometallics |
| Year of publication | 2010 |
| Journal volume | 29 |
| Journal issue | 18 |
| Pages of publication | 4115 |
| a | 25.249 ± 0.006 Å |
| b | 15.334 ± 0.003 Å |
| c | 17.601 ± 0.004 Å |
| α | 90° |
| β | 123.546 ± 0.001° |
| γ | 90° |
| Cell volume | 5680 ± 2 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173.15 K |
| Number of distinct elements | 5 |
| Space group number | 9 |
| Hermann-Mauguin space group symbol | C 1 c 1 |
| Hall space group symbol | C -2yc |
| Residual factor for all reflections | 0.0336 |
| Residual factor for significantly intense reflections | 0.0316 |
| Weighted residual factors for significantly intense reflections | 0.0675 |
| Weighted residual factors for all reflections included in the refinement | 0.0686 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4066711.html
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