Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4066712
Preview
Coordinates | 4066712.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H40 O3 Si2 W |
---|---|
Calculated formula | C32 H40 O3 Si2 W |
SMILES | [W]1234(C5[Si](OC(C=5[Si](C)(C)C)(C)C)(c5ccccc5)c5ccccc5)(C#[O])(C#[O])[c]5([c]2([c]3([c]4([c]51C)C)C)C)C |
Title of publication | Conversion of an Acetylide−Silylene Complex to an Alkenylcarbyne Complex by Consecutive Ketone Addition and Base-Induced Silanone Elimination |
Authors of publication | Sakaba, Hiroyuki; Yabe-Yoshida, Mako; Oike, Hiroyuki; Kabuto, Chizuko |
Journal of publication | Organometallics |
Year of publication | 2010 |
Journal volume | 29 |
Journal issue | 18 |
Pages of publication | 4115 |
a | 19.4764 ± 0.0015 Å |
b | 8.5385 ± 0.0004 Å |
c | 20.4172 ± 0.0017 Å |
α | 90° |
β | 115.625 ± 0.001° |
γ | 90° |
Cell volume | 3061.4 ± 0.4 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.038 |
Residual factor for significantly intense reflections | 0.0351 |
Weighted residual factors for significantly intense reflections | 0.0529 |
Weighted residual factors for all reflections included in the refinement | 0.0536 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.252 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4066712.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.