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Information card for entry 4066712
Preview
| Coordinates | 4066712.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H40 O3 Si2 W |
|---|---|
| Calculated formula | C32 H40 O3 Si2 W |
| SMILES | [W]1234(C5[Si](OC(C=5[Si](C)(C)C)(C)C)(c5ccccc5)c5ccccc5)(C#[O])(C#[O])[c]5([c]2([c]3([c]4([c]51C)C)C)C)C |
| Title of publication | Conversion of an Acetylide−Silylene Complex to an Alkenylcarbyne Complex by Consecutive Ketone Addition and Base-Induced Silanone Elimination |
| Authors of publication | Sakaba, Hiroyuki; Yabe-Yoshida, Mako; Oike, Hiroyuki; Kabuto, Chizuko |
| Journal of publication | Organometallics |
| Year of publication | 2010 |
| Journal volume | 29 |
| Journal issue | 18 |
| Pages of publication | 4115 |
| a | 19.4764 ± 0.0015 Å |
| b | 8.5385 ± 0.0004 Å |
| c | 20.4172 ± 0.0017 Å |
| α | 90° |
| β | 115.625 ± 0.001° |
| γ | 90° |
| Cell volume | 3061.4 ± 0.4 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.038 |
| Residual factor for significantly intense reflections | 0.0351 |
| Weighted residual factors for significantly intense reflections | 0.0529 |
| Weighted residual factors for all reflections included in the refinement | 0.0536 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.252 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4066712.html
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Users of the data should acknowledge the original authors of the
structural data.