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Information card for entry 4067372
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Coordinates | 4067372.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | tris(o-ethoxyphenyl)germane |
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Formula | C24 H28 Ge O3 |
Calculated formula | C24 H28 Ge O3 |
SMILES | [GeH](c1ccccc1OCC)(c1ccccc1OCC)c1ccccc1OCC |
Title of publication | Use of73Ge NMR Spectroscopy and X-ray Crystallography for the Study of Electronic Interactions in Substituted Tetrakis(phenyl)-, -(phenoxy)-, and -(thiophenoxy)germanes |
Authors of publication | Yoder, Claude H.; Agee, Tamara M.; Griffith, Allison K.; Schaeffer, Charles D.; Carroll, Mary J.; DeToma, Alaina S.; Fleisher, Adam J.; Gettel, Cameron J.; Rheingold, Arnold L. |
Journal of publication | Organometallics |
Year of publication | 2010 |
Journal volume | 29 |
Journal issue | 3 |
Pages of publication | 582 |
a | 8.8594 ± 0.0008 Å |
b | 11.422 ± 0.0009 Å |
c | 11.5301 ± 0.0009 Å |
α | 78.028 ± 0.002° |
β | 80.456 ± 0.002° |
γ | 69.188 ± 0.001° |
Cell volume | 1061.48 ± 0.15 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0452 |
Residual factor for significantly intense reflections | 0.0388 |
Weighted residual factors for significantly intense reflections | 0.0996 |
Weighted residual factors for all reflections included in the refinement | 0.104 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4067372.html
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