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Information card for entry 4068722
Preview
| Coordinates | 4068722.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C21 H40 F6 N2 Os P2 |
|---|---|
| Calculated formula | C21 H40 F6 N2 Os P2 |
| SMILES | [OsH]123([P](C(C)C)(C(C)C)C(C)C)([N]#CC)([N]#CC)[CH]4=[CH]1CC[CH]2=[CH]3CC4.[P](F)(F)(F)(F)(F)[F-] |
| Title of publication | Behavior of OsH2Cl2(PiPr3)2in Acetonitrile: The Importance of the Small Details |
| Authors of publication | Esteruelas, Miguel A.; Fuertes, Sara; Oliván, Montserrat; Oñate, Enrique |
| Journal of publication | Organometallics |
| Year of publication | 2009 |
| Journal volume | 28 |
| Journal issue | 5 |
| Pages of publication | 1582 |
| a | 14.814 ± 0.006 Å |
| b | 28.694 ± 0.012 Å |
| c | 11.889 ± 0.005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5054 ± 4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 56 |
| Hermann-Mauguin space group symbol | P c c n |
| Hall space group symbol | -P 2ab 2ac |
| Residual factor for all reflections | 0.0668 |
| Residual factor for significantly intense reflections | 0.0523 |
| Weighted residual factors for significantly intense reflections | 0.0887 |
| Weighted residual factors for all reflections included in the refinement | 0.0928 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.232 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4068722.html
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Users of the data should acknowledge the original authors of the
structural data.