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Information card for entry 4069997
Preview
Coordinates | 4069997.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C51 H57 N O2 Si2 Zr |
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Calculated formula | C51 H57 N O2 Si2 Zr |
SMILES | [Zr]12(Cc3ccccc3)(Cc3ccccc3)Oc3c([Si](C)(C)C(C)(C)C)cc4ccccc4c3c3cccc([n]13)c1c(O2)c([Si](C)(C)C(C)(C)C)cc2ccccc12 |
Title of publication | Group 4 Post-metallocene Complexes Incorporating Tridentate Silyl-Substituted Bis(naphthoxy)pyridine and Bis(naphthoxy)thiophene Ligands: Probing Systems for “Oscillating” Olefin Polymerization Catalysis |
Authors of publication | Kirillov, Evgueni; Roisnel, Thierry; Razavi, Abbas; Carpentier, Jean-François |
Journal of publication | Organometallics |
Year of publication | 2009 |
Journal volume | 28 |
Journal issue | 17 |
Pages of publication | 5036 |
a | 12.881 ± 0.003 Å |
b | 11.707 ± 0.003 Å |
c | 30.696 ± 0.007 Å |
α | 90° |
β | 100.641 ± 0.012° |
γ | 90° |
Cell volume | 4549.3 ± 1.9 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1614 |
Residual factor for significantly intense reflections | 0.1022 |
Weighted residual factors for significantly intense reflections | 0.2365 |
Weighted residual factors for all reflections included in the refinement | 0.2734 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.016 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4069997.html
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