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Information card for entry 4069997
Preview
| Coordinates | 4069997.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C51 H57 N O2 Si2 Zr |
|---|---|
| Calculated formula | C51 H57 N O2 Si2 Zr |
| SMILES | [Zr]12(Cc3ccccc3)(Cc3ccccc3)Oc3c([Si](C)(C)C(C)(C)C)cc4ccccc4c3c3cccc([n]13)c1c(O2)c([Si](C)(C)C(C)(C)C)cc2ccccc12 |
| Title of publication | Group 4 Post-metallocene Complexes Incorporating Tridentate Silyl-Substituted Bis(naphthoxy)pyridine and Bis(naphthoxy)thiophene Ligands: Probing Systems for “Oscillating” Olefin Polymerization Catalysis |
| Authors of publication | Kirillov, Evgueni; Roisnel, Thierry; Razavi, Abbas; Carpentier, Jean-François |
| Journal of publication | Organometallics |
| Year of publication | 2009 |
| Journal volume | 28 |
| Journal issue | 17 |
| Pages of publication | 5036 |
| a | 12.881 ± 0.003 Å |
| b | 11.707 ± 0.003 Å |
| c | 30.696 ± 0.007 Å |
| α | 90° |
| β | 100.641 ± 0.012° |
| γ | 90° |
| Cell volume | 4549.3 ± 1.9 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1614 |
| Residual factor for significantly intense reflections | 0.1022 |
| Weighted residual factors for significantly intense reflections | 0.2365 |
| Weighted residual factors for all reflections included in the refinement | 0.2734 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.016 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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