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Information card for entry 4069998
Preview
Coordinates | 4069998.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C88 H71 Hf N O2 Si2 |
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Calculated formula | C88 H71 Hf N O2 Si2 |
SMILES | [Hf]12([n]3c(c4c(O1)c([Si](c1ccccc1)(c1ccccc1)c1ccccc1)cc1ccccc41)cccc3c1c(O2)c([Si](c2ccccc2)(c2ccccc2)c2ccccc2)cc2ccccc12)(Cc1ccccc1)Cc1ccccc1.c1ccccc1.Cc1ccccc1 |
Title of publication | Group 4 Post-metallocene Complexes Incorporating Tridentate Silyl-Substituted Bis(naphthoxy)pyridine and Bis(naphthoxy)thiophene Ligands: Probing Systems for “Oscillating” Olefin Polymerization Catalysis |
Authors of publication | Kirillov, Evgueni; Roisnel, Thierry; Razavi, Abbas; Carpentier, Jean-François |
Journal of publication | Organometallics |
Year of publication | 2009 |
Journal volume | 28 |
Journal issue | 17 |
Pages of publication | 5036 |
a | 14.3381 ± 0.0006 Å |
b | 27.0836 ± 0.0012 Å |
c | 19.047 ± 0.0008 Å |
α | 90° |
β | 108.943 ± 0.002° |
γ | 90° |
Cell volume | 6995.9 ± 0.5 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0853 |
Residual factor for significantly intense reflections | 0.058 |
Weighted residual factors for significantly intense reflections | 0.1002 |
Weighted residual factors for all reflections included in the refinement | 0.1092 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.053 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4069998.html
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Users of the data should acknowledge the original authors of the
structural data.