Information card for entry 4070516

Structure parameters

• Formula: C56 H42 O7 P2 Ru3 Te4
• Calculated formula: C56 H42 O7 P2 Ru3 Te4
• SMILES: [O]#C[Ru]123(C#[O])[Te](c4ccccc4)[Ru]4(C#[O])([Te]1[Ru](C#[O])([Te]2c1ccccc1)([Te]4c1ccccc1)(C(=O)c1ccccc1)C#[O])([P](C[P]3(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)C#[O]
• Title of publication: Facile E−E and E−C Bond Activation of PhEEPh (E = Te, Se, S) by Ruthenium Carbonyl Clusters: Formation of Di- and Triruthenium Complexes Bearing Bridging dppm and Phenylchalcogenide and Capping Chalcogenido Ligands
• Authors of publication: Begum, Noorjahan; Hyder, Md. Iqbal; Hassan, Mohammad R.; Kabir, Shariff E.; Bennett, Dennis W.; Haworth, Daniel T.; Siddiquee, Tasneem A.; Rokhsana, Dalia; Sharmin, Ayesha; Rosenberg, Edward
• Journal of publication: Organometallics
• Year of publication: 2008
• Journal volume: 27
• Journal issue: 7
• Pages of publication: 1550
• a: 14.324 ± 0.004 Å
• b: 20.6 ± 0.005 Å
• c: 20.514 ± 0.003 Å
• α: 90°
• β: 103.01 ± 0.02°
• γ: 90°
• Cell volume: 5898 ± 2 ų
• Cell temperature: 296 ± 2 K
• Ambient diffraction temperature: 296 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.061
• Residual factor for significantly intense reflections: 0.0477
• Weighted residual factors for significantly intense reflections: 0.1467
• Weighted residual factors for all reflections included in the refinement: 0.1559
• Goodness-of-fit parameter for all reflections included in the refinement: 1.062
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No