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Information card for entry 4071262
Preview
Coordinates | 4071262.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | emA |
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Formula | C27 H45 La N2 Si |
Calculated formula | C27 H45 La N2 Si |
SMILES | [c]12([c]3([c]4([c]5([c]1(C)[La]167892345([c]2([c]1([c]6([c]7([c]82C)C)C)C)C)[N](=C\[Si](C)(C)C)/N9CC=C)C)C)C)C |
Title of publication | Diazomethane Insertion into Lanthanide− and Yttrium−C(allyl) Bonds To Form the η2-Hydrazonato Complexes (C5Me5)2Ln[η2(N,N′)-RNNCHSiMe3] (R = C3H5) |
Authors of publication | Evans, William J.; Montalvo, Elizabeth; Champagne, Timothy M.; Ziller, Joseph W.; DiPasquale, Antonio G.; Rheingold, Arnold L. |
Journal of publication | Organometallics |
Year of publication | 2008 |
Journal volume | 27 |
Journal issue | 14 |
Pages of publication | 3582 |
a | 11.505 ± 0.0018 Å |
b | 14.053 ± 0.002 Å |
c | 17.978 ± 0.003 Å |
α | 90° |
β | 102.539 ± 0.002° |
γ | 90° |
Cell volume | 2837.4 ± 0.8 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0425 |
Residual factor for significantly intense reflections | 0.0339 |
Weighted residual factors for significantly intense reflections | 0.0653 |
Weighted residual factors for all reflections included in the refinement | 0.0677 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.089 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4071262.html
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