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Information card for entry 4071542
Preview
| Coordinates | 4071542.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H47 Cl N P2 Rh Si |
|---|---|
| Calculated formula | C28 H47 Cl N P2 Rh Si |
| SMILES | [RhH]12([P](c3cc(ccc3N2c2ccc(cc2[P]1(C(C)C)C(C)C)C)C)(C(C)C)C(C)C)[Si](Cl)(C)C |
| Title of publication | Oxidative Addition Reactions of Silyl Halides with the (PNP)Rh Fragment |
| Authors of publication | Gatard, Sylvain; Chen, Chun-Hsing; Foxman, Bruce M.; Ozerov, Oleg V. |
| Journal of publication | Organometallics |
| Year of publication | 2008 |
| Journal volume | 27 |
| Journal issue | 23 |
| Pages of publication | 6257 |
| a | 30.0033 ± 0.0008 Å |
| b | 11.4958 ± 0.0003 Å |
| c | 18.824 ± 0.0005 Å |
| α | 90° |
| β | 111.205 ± 0.001° |
| γ | 90° |
| Cell volume | 6053 ± 0.3 Å3 |
| Cell temperature | 120 K |
| Ambient diffraction temperature | 120 K |
| Number of distinct elements | 7 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.034 |
| Residual factor for significantly intense reflections | 0.0271 |
| Weighted residual factors for all reflections | 0.0644 |
| Weighted residual factors for significantly intense reflections | 0.0625 |
| Weighted residual factors for all reflections included in the refinement | 0.0644 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.9732 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4071542.html
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Users of the data should acknowledge the original authors of the
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