Information card for entry 4072117

Structure parameters

• Formula: C22 H56 B2 P2 Pb Si2
• Calculated formula: C22 H56 B2 P2 Pb Si2
• SMILES: [Pb]1[C@]([P]([BH3])(CCC)CCC)([Si](C)(C)C)CC[C@@]1([P]([BH3])(CCC)CCC)[Si](C)(C)C.[Pb]1[C@@]([P]([BH3])(CCC)CCC)([Si](C)(C)C)CC[C@]1([P]([BH3])(CCC)CCC)[Si](C)(C)C
• Title of publication: Agostic-Type B−H···Pb Interactions Stabilize a Dialkylplumbylene. Structure of and Bonding in [{nPr2P(BH3)}(Me3Si)C(CH2)]2Pb
• Authors of publication: Izod, Keith; McFarlane, William; Wills, Corinne; Clegg, William; Harrington, Ross W.
• Journal of publication: Organometallics
• Year of publication: 2008
• Journal volume: 27
• Journal issue: 17
• Pages of publication: 4386
• a: 11.4175 ± 0.0008 Å
• b: 17.6207 ± 0.0013 Å
• c: 16.6197 ± 0.0012 Å
• α: 90°
• β: 106.796 ± 0.001°
• γ: 90°
• Cell volume: 3201 ± 0.4 ų
• Cell temperature: 120 ± 2 K
• Ambient diffraction temperature: 120 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0508
• Residual factor for significantly intense reflections: 0.0437
• Weighted residual factors for significantly intense reflections: 0.0899
• Weighted residual factors for all reflections included in the refinement: 0.0929
• Goodness-of-fit parameter for all reflections included in the refinement: 1.05
• Diffraction radiation wavelength: 0.6895 Å
• Diffraction radiation type: synchrotron
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No