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Information card for entry 4072156
Preview
Coordinates | 4072156.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H76 Cl2 Cu2 N2 O2 |
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Calculated formula | C54 H76 Cl2 Cu2 N2 O2 |
SMILES | [Cl]1[Cu]2([N](=Cc3c(O2)c(cc(c3)C(C)(C)C)C(C)(C)C)c2c(cccc2C(C)C)C(C)C)[Cl][Cu]21Oc1c(C=[N]2c2c(cccc2C(C)C)C(C)C)cc(cc1C(C)(C)C)C(C)(C)C |
Title of publication | Copper(II) Ethylene Polymerization Catalysts: Do They Really Exist? |
Authors of publication | Olson, Jeremy A.; Boyd, Ramon; Quail, J. Wilson; Foley, Stephen R. |
Journal of publication | Organometallics |
Year of publication | 2008 |
Journal volume | 27 |
Journal issue | 20 |
Pages of publication | 5333 |
a | 12.7591 ± 0.0006 Å |
b | 14.5248 ± 0.0009 Å |
c | 17.2981 ± 0.0011 Å |
α | 111.594 ± 0.002° |
β | 100.07 ± 0.003° |
γ | 104.797 ± 0.003° |
Cell volume | 2750 ± 0.3 Å3 |
Cell temperature | 295 ± 2 K |
Ambient diffraction temperature | 295 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0832 |
Residual factor for significantly intense reflections | 0.0513 |
Weighted residual factors for significantly intense reflections | 0.1097 |
Weighted residual factors for all reflections included in the refinement | 0.1244 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.054 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4072156.html
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