Information card for entry 4073343

Structure parameters

• Formula: C53 H79 N4 Rh Si4 Sn
• Calculated formula: C53 H79 N4 Rh Si4 Sn
• SMILES: c1(cc(cc(c1)C)C)N1[Si](C)(C)[Si]2(C)[Si](C)(C)N(c3cc(cc(c3)C)C)[Sn]1(N(c1cc(cc(c1)C)C)[Si]2(C)C)[Rh]123([CH]4=[CH]1CC[CH]2=[CH]3CC4)C#[N]C1CCCCC1.c1(ccccc1)C
• Title of publication: Flexibly Coordinating Tris(arylamido)stannates as Ligands: A [Rh]+/[Sn]-Zwitterion as an Intermediate in the Formation of Rh−Sn Complexes
• Authors of publication: Kilian, Michaela; Wadepohl, Hubert; Gade, Lutz H.
• Journal of publication: Organometallics
• Year of publication: 2007
• Journal volume: 26
• Journal issue: 13
• Pages of publication: 3076
• a: 12.7606 ± 0.0009 Å
• b: 13.836 ± 0.001 Å
• c: 31.05 ± 0.002 Å
• α: 90°
• β: 91.829 ± 0.001°
• γ: 90°
• Cell volume: 5479.3 ± 0.7 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0729
• Residual factor for significantly intense reflections: 0.0466
• Weighted residual factors for significantly intense reflections: 0.1089
• Weighted residual factors for all reflections included in the refinement: 0.1209
• Goodness-of-fit parameter for all reflections included in the refinement: 1.105
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No