Information card for entry 4073342

Structure parameters

• Formula: C57 H75 N3 O3 P Rh Si4 Sn
• Calculated formula: C57 H75 N3 O3 P Rh Si4 Sn
• SMILES: C[Si]1(C)N(c2cc(cc(c2)C)C)[Sn]2(N(c3cc(cc(c3)C)C)[Si](C)(C)[Si]1(C)[Si](C)(C)N2c1cc(cc(c1)C)C)[Rh]123([CH]4=[CH]1CC[CH]2=[CH]3CC4)[P](Oc1ccccc1)(Oc1ccccc1)Oc1ccccc1
• Title of publication: Flexibly Coordinating Tris(arylamido)stannates as Ligands: A [Rh]+/[Sn]-Zwitterion as an Intermediate in the Formation of Rh−Sn Complexes
• Authors of publication: Kilian, Michaela; Wadepohl, Hubert; Gade, Lutz H.
• Journal of publication: Organometallics
• Year of publication: 2007
• Journal volume: 26
• Journal issue: 13
• Pages of publication: 3076
• a: 12.3271 ± 0.001 Å
• b: 12.8709 ± 0.001 Å
• c: 20.6506 ± 0.0017 Å
• α: 72.17 ± 0.001°
• β: 89.627 ± 0.001°
• γ: 87.669 ± 0.002°
• Cell volume: 3116.4 ± 0.4 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 8
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0742
• Residual factor for significantly intense reflections: 0.042
• Weighted residual factors for significantly intense reflections: 0.0951
• Weighted residual factors for all reflections included in the refinement: 0.1064
• Goodness-of-fit parameter for all reflections included in the refinement: 0.983
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No