Information card for entry 4073375

Structure parameters

• Formula: C37 H59 Ga N2 Ni O Si2
• Calculated formula: C37 H59 Ga N2 Ni O Si2
• SMILES: [Ga]1(N(C(=CC(=[N]1c1c(cccc1C(C)C)C(C)C)C)C)c1c(cccc1C(C)C)C(C)C)[Ni]123[CH2]=[CH]1[Si](O[Si](C)(C)[CH]2=[CH2]3)(C)C
• Title of publication: Nickel Olefin Complexes Supported by GaI(DDP)†
• Authors of publication: Kempter, Andreas; Gemel, Christian; Cadenbach, Thomas; Fischer, Roland A.
• Journal of publication: Organometallics
• Year of publication: 2007
• Journal volume: 26
• Journal issue: 17
• Pages of publication: 4257
• a: 11.658 ± 0.003 Å
• b: 17.539 ± 0.002 Å
• c: 20.306 ± 0.004 Å
• α: 97.219 ± 0.014°
• β: 105.796 ± 0.019°
• γ: 91.338 ± 0.014°
• Cell volume: 3956.3 ± 1.4 ų
• Cell temperature: 105 ± 2 K
• Ambient diffraction temperature: 105 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.2028
• Residual factor for significantly intense reflections: 0.0598
• Weighted residual factors for significantly intense reflections: 0.0794
• Weighted residual factors for all reflections included in the refinement: 0.1048
• Goodness-of-fit parameter for all reflections included in the refinement: 0.623
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No