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Information card for entry 4073376
Preview
| Coordinates | 4073376.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C37 H56 Ga N2 Ni2 |
|---|---|
| Calculated formula | C37 H56 Ga N2 Ni2 |
| SMILES | [Ga]12([Ni]345([Ni]671([CH2]=[CH2]6)([CH2]=[CH2]7)[CH]3=[CH2]4)[CH2]=[CH2]5)[N](=C(C=C(N2c1c(cccc1C(C)C)C(C)C)C)C)c1c(cccc1C(C)C)C(C)C |
| Title of publication | Nickel Olefin Complexes Supported by GaI(DDP)† |
| Authors of publication | Kempter, Andreas; Gemel, Christian; Cadenbach, Thomas; Fischer, Roland A. |
| Journal of publication | Organometallics |
| Year of publication | 2007 |
| Journal volume | 26 |
| Journal issue | 17 |
| Pages of publication | 4257 |
| a | 10.4969 ± 0.0015 Å |
| b | 19.79 ± 0.003 Å |
| c | 17.502 ± 0.003 Å |
| α | 90° |
| β | 104.556 ± 0.014° |
| γ | 90° |
| Cell volume | 3519.1 ± 1 Å3 |
| Cell temperature | 113 ± 2 K |
| Ambient diffraction temperature | 113 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.2762 |
| Residual factor for significantly intense reflections | 0.0558 |
| Weighted residual factors for significantly intense reflections | 0.078 |
| Weighted residual factors for all reflections included in the refinement | 0.0988 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.551 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4073376.html
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