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Information card for entry 4073377
Preview
| Coordinates | 4073377.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C35 H53 Ga N2 Ni2 |
|---|---|
| Calculated formula | C35 H53 Ga N2 Ni2 |
| SMILES | [Ga]12([Ni]345([Ni]61([CH2]3C4)[CH2]=[CH2]6)[CH2]=[CH2]5)N(C(=CC(C)=[N]2c1c(C(C)C)cccc1C(C)C)C)c1c(cccc1C(C)C)C(C)C |
| Title of publication | Nickel Olefin Complexes Supported by GaI(DDP)† |
| Authors of publication | Kempter, Andreas; Gemel, Christian; Cadenbach, Thomas; Fischer, Roland A. |
| Journal of publication | Organometallics |
| Year of publication | 2007 |
| Journal volume | 26 |
| Journal issue | 17 |
| Pages of publication | 4257 |
| a | 11.107 ± 0.004 Å |
| b | 11.538 ± 0.004 Å |
| c | 13.631 ± 0.005 Å |
| α | 87.64 ± 0.03° |
| β | 80.73 ± 0.03° |
| γ | 76.94 ± 0.03° |
| Cell volume | 1679.4 ± 1.1 Å3 |
| Cell temperature | 113 ± 2 K |
| Ambient diffraction temperature | 113 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1311 |
| Residual factor for significantly intense reflections | 0.0461 |
| Weighted residual factors for significantly intense reflections | 0.0521 |
| Weighted residual factors for all reflections included in the refinement | 0.066 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.703 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4073377.html
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