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Information card for entry 4073390
Preview
Coordinates | 4073390.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H32 Sn V2 |
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Calculated formula | C36 H32 Sn V2 |
SMILES | [Sn]([c]12[cH]3[V]456789%10%111([cH]3[cH]4[cH]25)[CH]1=[CH]%11C%10[CH]9=[CH]8[CH]7=[CH]61)([c]12[cH]3[V]456789%10%111([cH]3[cH]4[cH]25)[CH]1=[CH]%11[CH]%10=[CH]9[CH]8=[CH]7C61)(c1ccccc1)c1ccccc1 |
Title of publication | Tetrakis([5]trovacenyl)tin: Synthesis, Structure, and Intramolecular Communication† |
Authors of publication | Elschenbroich, Christoph; Lu, Feng; Nowotny, Mathias; Burghaus, Olaf; Pietzonka, Clemens; Harms, Klaus |
Journal of publication | Organometallics |
Year of publication | 2007 |
Journal volume | 26 |
Journal issue | 16 |
Pages of publication | 4025 |
a | 9.3888 ± 0.0011 Å |
b | 11.7664 ± 0.0015 Å |
c | 13.4341 ± 0.0016 Å |
α | 80.25 ± 0.01° |
β | 82.34 ± 0.01° |
γ | 78.3 ± 0.01° |
Cell volume | 1424.7 ± 0.3 Å3 |
Cell temperature | 193 ± 2 K |
Ambient diffraction temperature | 193 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.026 |
Residual factor for significantly intense reflections | 0.0213 |
Weighted residual factors for significantly intense reflections | 0.0517 |
Weighted residual factors for all reflections included in the refinement | 0.0527 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.972 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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