Information card for entry 4073526

Structure parameters

• Formula: C42 H104 N6 O4 P4 Si4 Y2
• Calculated formula: C42 H104 N6 O4 P4 Si4 Y2
• SMILES: [Y]1234([O]([Y]567([O]4P(=[N]5CC(C[N]6=P(O7)(C(C)C)C(C)C)(C)C)(C(C)C)C(C)C)N([SiH](C)C)[SiH](C)C)P(=[N]1CC(C[N]2=P(O3)(C(C)C)C(C)C)(C)C)(C(C)C)C(C)C)N([SiH](C)C)[SiH](C)C
• Title of publication: Synthesis and Characterization of a Series of Bis(oxo/thiophosphinic)diamido Yttrium Complexes and Their Application as Initiators for Lactide Ring-Opening Polymerization
• Authors of publication: Platel, Rachel H.; Hodgson, Linda M.; White, Andrew J. P.; Williams, Charlotte K.
• Journal of publication: Organometallics
• Year of publication: 2007
• Journal volume: 26
• Journal issue: 20
• Pages of publication: 4955
• a: 11.231 ± 0.002 Å
• b: 13.701 ± 0.003 Å
• c: 23.177 ± 0.005 Å
• α: 102.79 ± 0.02°
• β: 92.532 ± 0.016°
• γ: 114.151 ± 0.017°
• Cell volume: 3136.9 ± 1.3 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0984
• Residual factor for significantly intense reflections: 0.0682
• Weighted residual factors for significantly intense reflections: 0.1966
• Weighted residual factors for all reflections included in the refinement: 0.2031
• Goodness-of-fit parameter for all reflections included in the refinement: 1.076
• Diffraction radiation wavelength: 1.54248 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No