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Information card for entry 4073860
Preview
| Coordinates | 4073860.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C93 H40 B2 Cl6 Cr2 F40 O6 P2 |
|---|---|
| Calculated formula | C93 H40 B2 Cl6 Cr2 F40 O6 P2 |
| Title of publication | One-Electron Oxidations of the Methyldiphenylphosphonium Cyclopentadienylide Complexes M(η5-C5H4PMePh2)(CO)3(M = Cr, Mo, W): Formation and Dimerization of the 17-Electron, Metal-Centered Radicals [M(η5-C5H4PMePh2)(CO)3]+ |
| Authors of publication | Brownie, John H.; Baird, Michael C.; Laws, Derek R.; Geiger, William E. |
| Journal of publication | Organometallics |
| Year of publication | 2007 |
| Journal volume | 26 |
| Journal issue | 24 |
| Pages of publication | 5890 |
| a | 9.8319 ± 0.0004 Å |
| b | 12.8275 ± 0.0006 Å |
| c | 19.633 ± 0.0009 Å |
| α | 70.935 ± 0.001° |
| β | 83.12 ± 0.001° |
| γ | 88.67 ± 0.001° |
| Cell volume | 2323.09 ± 0.18 Å3 |
| Cell temperature | 180 ± 2 K |
| Ambient diffraction temperature | 180 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0467 |
| Residual factor for significantly intense reflections | 0.0351 |
| Weighted residual factors for significantly intense reflections | 0.094 |
| Weighted residual factors for all reflections included in the refinement | 0.1023 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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