Information card for entry 4074002
| Formula |
C28 H28 Si |
| Calculated formula |
C28 H28 Si |
| SMILES |
c1(c(cc(cc1C)C)C)[Si](c1ccccc1)(c1cccc2ccccc12)CC=C |
| Title of publication |
The 2,4,6-Trimethoxyphenyl Unit as a Unique Protecting Group for Silicon in Synthesis and the Silylation Potential of (2,4,6-Trimethoxyphenyl)silanes |
| Authors of publication |
Popp, Friedrich; Nätscher, Jennifer B.; Daiss, Jürgen O.; Burschka, Christian; Tacke, Reinhold |
| Journal of publication |
Organometallics |
| Year of publication |
2007 |
| Journal volume |
26 |
| Journal issue |
24 |
| Pages of publication |
6014 |
| a |
7.0858 ± 0.0014 Å |
| b |
9.863 ± 0.002 Å |
| c |
16.141 ± 0.003 Å |
| α |
82.83 ± 0.03° |
| β |
78.3 ± 0.03° |
| γ |
89.25 ± 0.03° |
| Cell volume |
1095.9 ± 0.4 Å3 |
| Cell temperature |
183 ± 2 K |
| Ambient diffraction temperature |
183 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0504 |
| Residual factor for significantly intense reflections |
0.0399 |
| Weighted residual factors for significantly intense reflections |
0.104 |
| Weighted residual factors for all reflections included in the refinement |
0.1102 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.024 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4074002.html
