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Information card for entry 4074779
Preview
Coordinates | 4074779.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C66 H72 Li O4 P4 S4 Tm |
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Calculated formula | C66 H72 Li O4 P4 S4 Tm |
SMILES | [Tm]1234([S]=P(C3=P(S1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)[S]=P(C4=P(S2)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1.[O]1(CCCC1)[Li]([O]1CCCC1)([O]1CCCC1)[O]1CCCC1 |
Title of publication | Thulium Alkylidene Complexes: Synthesis, X-ray Structures, and Reactivity |
Authors of publication | Cantat, Thibault; Jaroschik, Florian; Ricard, Louis; Le Floch, Pascal; Nief, François; Mézailles, Nicolas |
Journal of publication | Organometallics |
Year of publication | 2006 |
Journal volume | 25 |
Journal issue | 5 |
Pages of publication | 1329 - 1332 |
a | 14.886 ± 0.001 Å |
b | 20.606 ± 0.001 Å |
c | 22.273 ± 0.001 Å |
α | 74.52 ± 0.001° |
β | 79.54 ± 0.001° |
γ | 76.42 ± 0.001° |
Cell volume | 6348.4 ± 0.6 Å3 |
Cell temperature | 150 ± 0.1 K |
Ambient diffraction temperature | 150 ± 0.1 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0961 |
Residual factor for significantly intense reflections | 0.071 |
Weighted residual factors for significantly intense reflections | 0.2043 |
Weighted residual factors for all reflections included in the refinement | 0.2227 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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