Information card for entry 4075713

Structure parameters

• Formula: C34 H50 Mg N4 Si2
• Calculated formula: C34 H50 Mg N4 Si2
• SMILES: [Mg](N([Si](C)(C)C)c1c(cc(cc1C)C)C)(N([Si](C)(C)C)c1c(cc(cc1C)C)C)([n]1ccccc1)[n]1ccccc1
• Title of publication: Synthesis and Structural Characterization of Magnesium Amide Complexes Containing −N[(R)(SiMe3)] Ligands
• Authors of publication: Tang, Yongjun; Zakharov, Lev N.; Rheingold, Arnold L.; Kemp, Richard A.
• Journal of publication: Organometallics
• Year of publication: 2005
• Journal volume: 24
• Journal issue: 5
• Pages of publication: 836
• a: 12.0451 ± 0.0007 Å
• b: 15.9172 ± 0.0009 Å
• c: 18.6838 ± 0.001 Å
• α: 91.729 ± 0.001°
• β: 101.358 ± 0.001°
• γ: 90.445 ± 0.001°
• Cell volume: 3510 ± 0.3 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0547
• Residual factor for significantly intense reflections: 0.0439
• Weighted residual factors for significantly intense reflections: 0.1101
• Weighted residual factors for all reflections included in the refinement: 0.1168
• Goodness-of-fit parameter for all reflections included in the refinement: 1.027
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No