Information card for entry 4075783
| Formula |
C32 H34 Ge Si |
| Calculated formula |
C32 H34 Ge Si |
| SMILES |
[Ge](C1(c2ccccc2c2c1cccc2)C)(C1([Si](C)(C)C)c2c(c3c1cccc3)cccc2)(C)C |
| Title of publication |
Difluorenylsilanes, -germanes, and -stannanes Exhibiting an Unprecedented Parallel Arrangement of the Fluorene Units |
| Authors of publication |
Nemes, Gabriela Cretiu; Silaghi-Dumitrescu, Luminita; Silaghi-Dumitrescu, Ioan; Escudié, Jean; Ranaivonjatovo, Henri; Molloy, Kieran C.; Mahon, Mary F.; Zukerman-Schpector, Julio |
| Journal of publication |
Organometallics |
| Year of publication |
2005 |
| Journal volume |
24 |
| Journal issue |
6 |
| Pages of publication |
1134 |
| a |
10.0281 ± 0.0007 Å |
| b |
15.8575 ± 0.001 Å |
| c |
17.1917 ± 0.001 Å |
| α |
90° |
| β |
92.231 ± 0.008° |
| γ |
90° |
| Cell volume |
2731.8 ± 0.3 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.1651 |
| Residual factor for significantly intense reflections |
0.0483 |
| Weighted residual factors for significantly intense reflections |
0.0956 |
| Weighted residual factors for all reflections included in the refinement |
0.1248 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.963 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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